課程資訊
課程名稱
分析化學二
Analytical Chemistry (Ⅱ) 
開課學期
106-2 
授課對象
理學院  化學系  
授課教師
張哲政 
課號
Chem2008 
課程識別碼
203 21220 
班次
 
學分
3.0 
全/半年
半年 
必/選修
必帶 
上課時間
星期一3,4(10:20~12:10)星期四2(9:10~10:00) 
上課地點
普101普101 
備註
初選不開放。本課程中文授課,使用英文教科書。外系生須經授課教師同意.詳化學系選課須知.須先修普化.
限學士班二年級以上 且 限本系所學生(含輔系、雙修生)
總人數上限:80人 
Ceiba 課程網頁
http://ceiba.ntu.edu.tw/1062Chem2008_ 
課程簡介影片
 
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課程概述

This course extends the knowledge of the analytical chemistry to include the fundamental principles and application of modern instrumental methods including electrochemistry, spectroscopic, and spectrometric and other methods. The topics covered have applications to many subject areas in Natural Sciences, Life Science and Engineering.
This course is presented in a lecture/discussion format. The content of the course includes
I. Introduction to Instrumental Analysis
A. Analytical Approach
B. Measurement Process
C. Classification
D. Method Selection
II. Neutron Activation Analysis
A. Principle
a) Measurement
• Radioactive decay rates
•Theory of Activation Method
b) Counting Statistics
•Radioactive decay distribution
•Standard deviation of counts
B. Experimental Considerations
a) Irradiation
b) Destructive Method
c) Nondestructive Method
C. Instrument
a) Neutron Source
• Reactor
• Thermal Neutron
b) Monochromator
• Flat Crystal Design
• Bent Crystal Design
c) -Ray Focusing
d) Detector
D. Scope/Application
E. Advantages and Disadvantages
III. Flow Injection Analysis
A. Apparatus
B. Band Broadening
C. Stopped-Flow Method
D. Flow Injection Titration
E. Merging Zones FIA
F. Variants of FIA
IV. Fundamentals of Spectroscopy/Spectrometry
A. Introduction to Spectroscopy
B. Characteristics of Electromagnetic radiation
C. Wave Property of Light and Optical Component
a) Interference
b) Transmission
c) Reflection
d) Refraction
e) Scattering
f) Diffraction
D. Particle Property of Light and Its Use
a) Photoelectric effect
b) Absorption
c) Emission
V. UV and Visible Absorption Spectrometry
A. Range and Type of UV/Vis Radiation
B. Principle
a) Molar Absorptivity
b) Spectroscopic Process
c) Effect of Multichromophores
d) d, f-electron Transition
C. Measurement
a) Standard Addition Method
b) Solvent Selection
c) Solvent Effect
d) Beer’s Law and Its Limitations
e) Spectrophotometric Uncertainty
D. Instrumentation
a) Single-Beam and Double-Beam Instruments
b) Sample Cell and Construction Materials
c) Source
d) Slit
e) Detector
E. Spectroscopic Information
a) Imaging
b) Qualitative
c) Quantitative
F. Spectral Analysis
a) Woodward-Fieser Rules
VI. Luminescence Spectroscopy
A. Luminescence
B. Principle
a) Spectroscopic Process
b) Quantum Yield
c) Favorable Condition for Luminescence
d) Emission Spectrum
e) 90˚ Detection
f) Luminescence Intensity
g) Type of Luminescence
C. Instrumentation
D. Spectroscopic Information
a) FL System
b) Fluorescent Agent
c) Use of Excited-State Molecules
d) Fluorescence Resonance Energy Transfer
VII. Infrared Spectroscopy
A. Range and Type of IR Radiation
B. Principle
a) Molecular Excitation
b) Type of Molecular Vibration
c) Normal Mode of Vibration
d) Spectroscopic Process
e) IR-Active Vibration
C. Instrumentation
a) Nondispersive Instrument
b) Dispersive Instrument
c) Sample Cell and Construction Materials
d) Source
e) Wavelength Selector
f) Detector
D. Spectroscopic Information
a) Functional Group
b) Quantitative
VIII. Raman Spectroscopy
A. Principle
a) Polarizability
b) Raman Scattering
c) Energy Shift
d) Raman-Active Vibration
e) Raman Scattering Intensity
f) Advantage Over IR
B. Instrumentation
a) Laser
C. Spectroscopic Information
D. Raman vs. IR
IX. Surface Analysis
A. X-ray Photoelectron Spectroscopy
B. Auger Electron Spectroscopy
C. Secondary Ion Mass Spectroscopy
D. Surface Plasmon Resonance
E. Electron Microprobe
F. Scanning Electron Microscopy
G. Scanning Probe Microscopy
X. Atomic Absorption Spectrometry
A. Spectroscopic Process
a) Absorption
b) Emission
B. Atomization
a) Flame
b) Electrothermal
c) Specialized
C. Method of Sample Introduction
a) Flame
b) Furnace
c) Plasma
D. Spectral Line Shape
a) Natural Line Width
i) Heisenberg Uncertainty Principle
ii) Full Width at Half Maximum
b) Pressure Broadening
c) Doppler Broadening
d) Background Radiation
e) Molecular Emission
f) Self-Absorption
E. Interference
a) Spectral
b) Chemical
F. AA Analytical Technique
a) Sample
b) Solvent
c) Calibration
d) Application
G. Instrumentation
a) Main Components
b) Component Layout
c) Sources
d) Spectrophotometers
H. Atomic Fluorescence Spectroscopy
a) Instrumentation
b) Interference
c) Application
XI. Atomic Emission Spectrometry
A. Plasma Source Spectrometry
a) Source
ICP
Microwave
Others
b) Spectrometer
• Sequential
• Multichannel
c) Others
B. Arc/Spark Spectrometry
a) Source
• DC Arc
• High-Voltage Spark
b) Application
C. Other Source Spectrometry
a) Source
• Flame Emission
• Glow Discharge
XII. Atomic X-Ray Spectroscopy
A. Fundamental
a) Emission
b) Absorption Spectra
c) X-ray Flourescence
b) X-ray Diffraction
B. Instrumentation
a) Source
b) Filter
c) Monochromator
d) Transducer
e) Signal Processor
C. X-ray Fluorescence Method
a) Instrument
b) Qualitative and Semiquantitative Analysis
c) Quantitative Analysis
D. X-ray Absorption Method
a) X-ray Diffraction Method
b) Identification of Crystalline Compounds
c) Interpretation of Diffraction Patterns
 

課程目標
This course provides students with the background theory and operation principles of electrochemical and spectroscopic instrumental analysis methods. The specific objectives of the course are as follows:
◎ to become familiar with the various instrumental methods currently available
◎ to develop an understanding of the theories upon which the principles of the common instrumental analysis procedures are based
◎ to understand the correlations of the instrumental analysis concepts and of various controllable and measurable quantities
◎ to learn how the different instrumental analysis methods are used to analyze samples
◎ to understand the limitations and strengths of particular analysis approaches
◎ to gain skill and competence in the use of related analytical standards/references
◎ to learn to apply chemical equilibria and stoichiometry to solve instrumental analysis problems
 
課程要求
出席與要求
學生出席聽講,且課堂上參與授課內容的討論,是學習的重要過程,對教材深入的了解極有幫助。雖然本課程不會每天監看出席,但是若學生無法規律上課,則請勿選修這門課。講義僅當次課堂分發。隨堂摘寫授課筆記是終身學習中的重要技能;學生應隨堂自行摘寫上課筆記。課堂中不得照相攝影,亦不得使用手機。

考試方式
考試以問答和敘述性、解釋性問題為主,其內容主要在於測試學生在分析化學之理論背景、操作原理、分析方法的設計、應用、優點和限制的理解。考試內容包括教科書和在課堂上討論的資料。期末考是一次統整型的考試,學生須將本學期所講授的內容做有意義的統整。考試過程中,所使用的計算機不得包含任何字典功能或科學常數表,且手機等通訊器材應另存它處。旁聽生不得參加考試。

補考
本課程的考試沒有補考。學生預定之日程表若與本課程之上課或考試時程有任何衝突,切勿修習本課程。學生若因身體不適而錯過考試,則應提出就診紀錄。

評分
課程評分依據下列表格計算:
第一次考試 (27%)*
第二次考試 (18%)*
翻轉教學 (20%)
期末考 (35%)
隨堂考 (x%)
* 兩次期中考成績較佳者佔學期成績27%,較差者佔18%。
翻轉教學的學習評估乃基於同儕(70%)和教授(30%)之評分。同儕評分包括同組(65%)和外組(35%)學生相互審定的評量成績。教授評分將基於學生準時(在演示當天上午8點前)發送至教授電子郵箱的powerpoint文件和翻轉學習的表現。翻轉學習的最終成績將是常態分布。
學生在不定期舉行的隨堂考中的表現,將做為微調學生之學期成績的參考依據。學生學期成績在通過邊緣者,將檢視審查其上課筆記,酌予微調其學期成績。

翻轉學習
本課程授課內容中,有關材料表面分析和層析法的學習將採用翻轉教室的教學模式,鼓勵學生建構自主學習的能力。該教學將應用“翻轉學習+同伴指導”的模式進行,使學生熟悉該二儀器分析方法的每個主題。每個學生組的翻轉教室成果,將以PowerPoint演示,演示側重於對指定主題在教科書和網路等適宜參考資料之相關知識的整合性瞭解的呈現。材料表面分析和層析法的主題如下:
Group Textbook section Main topic
1 21A-21C1 Intro to surface analysis, XPS
2 21C2, 21D1, 21E1, 21F1 AES,SIMS,SPR,eMicroprobe
3 21F2, 21G SEM, SPM
4 8A, 8C Intro to optical atomic spectrometry
5 8B, 9A, 9B AAS&AFS – atomization, instrumentation
6 9C-9E AAS&AFS – interference, AA technique, AFS
7 10A1-10A4 (p.243) Atomic emission – plasma source
8 10A4 (p.243) – 10C2 Atomic emission – plasma app, other sources
9 12A-12B2, 12B4 X-ray spectrometry – fundamental, instrument
10 12B5-12D3 X-ray spectrometry – processor, XRF, XAS

課程學生分組以異校、異院、異級、異性為原則。在演示過程中,所有學生均須依固定座位坐席,且必須主動參與演示後的討論。演示開始時將立刻點名。

榮譽法規
本課程嚴格執行校方有關作弊的規定。
 
預期每週課後學習時數
 
Office Hours
每週四 10:00~11:00
每週一 12:10~13:10 備註: 普101, start right after the class, until the last student leaves 
指定閱讀
Skoog, Holler, Crouch, Principles of Instrumental Analysis, 7th Ed., Cengage Learning, ISBN: 978-1-305-57721-3 
參考書目
James W. Robinson, Undergraduate Instrumental Analysis, Marcel Dekker
Francis Rouessac, Annick Rouessac, Chemical Analysis-Modern Instrumentation Methods and Techniques, 2nd Ed., Wiley, ISBN: 978-0-470-85902-5
K. A. Rubinson, J. F. Rubinson, Contemporary Instrumental Analysis, Prentice-Hall, Inc.
Skoog, West, Holler, Crouch, Fundamentals of Analytical Chemistry, 8th Ed., Thomson, ISBN: 0-534-41797-3
Daniel C. Harris, Quantitative Chemical Analysis, 8th Ed., W.H. Freeman and Company
 
評量方式
(僅供參考)
 
No.
項目
百分比
說明
1. 
期中考(二次) 
45% 
參見課程要求。學生在不定期舉行的隨堂考中的表現,將做為微調學生之學期成績的參考依據。學生學期成績在通過邊緣者,將檢視審查其上課筆記,酌予微調其學期成績。 
2. 
翻轉教學 
20% 
參見課程要求。學生在不定期舉行的隨堂考中的表現,將做為微調學生之學期成績的參考依據。學生學期成績在通過邊緣者,將檢視審查其上課筆記,酌予微調其學期成績。 
3. 
期末考 
35% 
參見課程要求。學生在不定期舉行的隨堂考中的表現,將做為微調學生之學期成績的參考依據。學生學期成績在通過邊緣者,將檢視審查其上課筆記,酌予微調其學期成績。 
 
課程進度
週次
日期
單元主題
第16週
6/01,6/04  Oral presentation 
第17週
6/08,6/11  Oral presentation